Christopher X. Ren

Christopher X. Ren

Remote sensing and machine learning researcher at Los Alamos National Laboratory

On the Detectability of Conflict: a Remote Sensing Study of the Rohingya Conflict

Published in 2020 IEEE Southwest Symposium on Image Analysis and Interpretation (SSIAI), 2020

Recommended citation: Ren, C.X., Calef, M.T., Durieux, A.M., Ziemann, A. and Theiler, J., 2020, March. On the Detectability of Conflict: a Remote Sensing Study of the Rohingya Conflict. In 2020 IEEE Southwest Symposium on Image Analysis and Interpretation (SSIAI) (pp. 86-89). IEEE. https://arxiv.org/pdf/2003.08874

Download paper here

Recommended citation: ‘Ren, C.X., Calef, M.T., Durieux, A.M., Ziemann, A. and Theiler, J., 2020, March. On the Detectability of Conflict: a Remote Sensing Study of the Rohingya Conflict. In 2020 IEEE Southwest Symposium on Image Analysis and Interpretation (SSIAI) (pp. 86-89). IEEE.’